Title: Prof. Dr.Department: Physics DepartmentPosition: AcademicianEmail: email@example.comTelephone: 0216 578 0000 (1673)Office: B607AkademikResumeResearch Interests Photonics Spectroscopic studies of nanoparticles Imaging, optical sensors Elctrical, mechanical, optical metrology Biography BSc: Manchester Metropolitan University 1987 Phd: Manchester University 1990 Courses GivenIntroduction to MetrologyIntroduction to OpticsPhotonicsElectromagnetism PublicationsSelected Papers International Journal of Thermophysics, (2015), ‘Fabrication and characterization of nanoporous silicon relative humidity sensors’, S. Aytekin, R. Ince, DOI: 10.1007/s10765-015-1979-z. Applied Optics, Vol. 50, Issue 19, pp. 3259-3267 (2011), Interferometric Investigation and Simulation of refractive Index In Glass Matrixes Containing Nanoparticles Of Varying Sizes, M. G. Feeney, R. Ince*, M.H. Yukselici, C. Allahverdi. Optics and Lasers in Engineering, Volume 46, Issue 11, Nov (2008), p. 842-847, The Influence of spatial frequency in partial spatial erasure of holographic diffraction gratings within LiNbO3:Fe., R. Ince, H.Yükselici, A. T. İnce, A.V. Tunç Opt. Communications Vol. 281 No. 14 (2008), 3831-6, a numerical method for determining refractive ındex of a glass sample from ıts ımplicit transcendental function, R. Ince, E. Sinir, M. G. Feeney, H. M Yukselici, A.T. Ince. Applied Opt, Vol. 46, No. 17, (2007), 3498-503, Decoupling Refractive Index And Geometric Thickness From Interferometric Measurements Of Quartz Sample Using a Fourth Order Polynomial, R. Ince, E. Huseyinoglu, Analytica Chimica Acta, 569 (2006) , 1-20, Analysis of the performance of Interferometry, Surface Plasmon Resonance and Luminescence as bio and chemosensors,.R. Ince, R. Narayanaswamy. Measurement, Vol. 39/2, (2006), 130-136, Prediction of absolute Seebeck coefficients at ITS-90 temperatures using an artificial neural network, R. Ince, H.S. Aytekin, A.T. İnce. Books Low-Dimensional and Nanostructured Materials and Devices, Properties, Synthesis, Characterization, Modelling and Applications, ch.4 ‘The Challenge to Develop Metrology at the Nanoscale’, R. Ince, Jan 2016,Springer, ISBN:978-3-319-25338-1. Low Dimensional Semiconductor Structures, H. Unlu and N.J.M. Horing (eds.), Ch.6 ‘Optical studies of semiconductor quantum dots’, Multiple authors NanoScience and Technology, Springer-Verlag, Berlin Heidelberg, 2012.